• Compound Semiconductor

Spectroscopic Characterization of Yield-killing Defects in Wide Bandgap Semiconductor Wafers

Wide bandgap semiconductors such as SiC, GaN, and diamond are critical materials for next-generation power electronics, optoelectronics, and quantum technologies. However, their performance is highly sensitive ...

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• Compound Semiconductor

Multimodal Characterization of Wide Bandgap Semiconductor Wafers

There are many factors that affect wafer yield such as uniformity and defectivity amongst others. Currently optical spectroscopies such as Raman and Photoluminescence are some of the techniques of choice in ass...

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